sw/device/tests/example_test_from_flash.c

// Copyright lowRISC contributors.
// Licensed under the Apache License, Version 2.0, see LICENSE for details.
// SPDX-License-Identifier: Apache-2.0

/**
 * This template serves as a starting point for writing software chip-level
 * tests that use the OpenTitan Test Framework (OTTF). This template is intended
 * to be copied and modified according to the instructions below.
 *
 * Plese delete all instructional comments after editing this template.
 */

/**
 * Uncomment if you want to log messages with `LOG_{INFO,WARNING,ERROR,FATAL()`.
 */
// #include "sw/device/lib/runtime/log.h"
#include "sw/device/lib/testing/test_framework/check.h"
#include "sw/device/lib/testing/test_framework/ottf_main.h"

/**
 * The OTTF expects this symbol to present, as it contains configuration
 * settings for running the test implemented in this file. DO NOT delete this
 * struct. However, you may modify the member assignments below according to the
 * instructions above each configuration member.
 */
const test_config_t kTestConfig = {
    /**
     * Set `enable_concurrency` to true if this test should run as a FreeRTOS
     * task (enabling the test to spawn additional concurrent FreeRTOS tasks).
     * When `enable_concurrency` is set to false, this test will run as a
     * bare-metal program. Note, for the majority of chip-level tests, this
     * should be set to false.
     */
    .enable_concurrency = false,
    /**
     * Set `can_clobber_uart` to true if this test will reconfigure the UART in
     * any way, since the OTTF uses the UART to communicate test results on
     * Verilator and FPGA platforms, it must be reconfigured by the OTTF before
     * test results are printed.
     */
    .can_clobber_uart = false,
};

/**
 * Override any of the default OTTF exception handlers (by uncommenting and
 * implementing them) if this test requires non-default exeception handling
 * logic. Delete those that do not need to be overridden.
 *
 * See `sw/device/lib/testing/test_framework/ottf_isrs.c` for implementation
 * details of the default OTTF exception handlers.
 */
// void ottf_exception_handler(void) {}
// void ottf_instr_misaligned_fault_handler(void) {}
// void ottf_instr_access_fault_handler(void) {}
// void ottf_illegal_instr_fault_handler(void) {}
// void ottf_breakpoint_handler(void) {}
// void ottf_load_store_fault_handler(void) {}
// void ottf_machine_ecall_handler(void) {}
// void ottf_user_ecall_handler(void) {}

/**
 * Override any of the default OTTF ISRs (by uncommenting and implementing them)
 * if this test requires non-default ISR logic. Delete those that do not need to
 * be overridden.
 *
 * See `sw/device/lib/testing/test_framework/ottf_isrs.c` for implementation
 * details of the default OTTF ISRs.
 */
// void ottf_software_isr(void) {}
// void ottf_timer_isr(void) {}
// void ottf_external_isr(void) {}

/**
 * Place data in flash that will need to persist across resets by marking with
 * with the section ".non_volatile_scratch"). Write to this region with the
 * flash controller DIF. Read from it with `abs_mmio_read32(...)`.
 */
// __attribute__((section(".non_volatile_scratch")))
// const volatile uint32_t non_volatile_data[SIZE_OF_DATA];

bool test_main(void) {
  /**
   * Place test code here.
   */

  /**
   * Return true if the test succeeds. Return false if it should fail.
   */
  return true;
}