blob: 4b5e272acf2551f92bdc94901e76fdcaafed14d0 [file] [log] [blame]
// Copyright lowRISC contributors.
// Licensed under the Apache License, Version 2.0, see LICENSE for details.
// SPDX-License-Identifier: Apache-2.0
{
// Name of the sim cfg - typically same as the name of the DUT.
name: chip
// Top level dut name (sv module).
dut: chip_earlgrey_asic
// Top level testbench name (sv module).
tb: tb
// Default simulator used to sign off.
tool: vcs
// Fusesoc core file used for building the file list.
fusesoc_core: lowrisc:dv:chip_sim:0.1
// Testplan hjson file.
testplan: "{proj_root}/hw/top_earlgrey/data/chip_testplan.hjson"
// RAL spec - used to generate the RAL model.
ral_spec: "{proj_root}/hw/top_earlgrey/data/top_earlgrey.hjson"
// Add additional tops for simulation.
sim_tops: ["pwrmgr_bind",
"xbar_main_bind",
"xbar_peri_bind"]
// Import additional common sim cfg files.
import_cfgs: [// Project wide common sim cfg file
"{proj_root}/hw/dv/tools/dvsim/common_sim_cfg.hjson",
// Common CIP test lists
"{proj_root}/hw/dv/tools/dvsim/tests/csr_tests.hjson",
// TODO #5484, comment these 2 lines out because spi host memory is dummy
// "{proj_root}/hw/dv/tools/dvsim/tests/mem_tests.hjson",
// xbar tests
"{proj_root}/hw/ip/tlul/generic_dv/xbar_tests.hjson",
// Config files to get the correct flags for otbn_memutil and otbn_tracer
"{proj_root}/hw/dv/verilator/memutil_dpi_scrambled_opts.hjson",
"{proj_root}/hw/ip/otbn/dv/memutil/otbn_memutil_sim_opts.hjson",
"{proj_root}/hw/ip/otbn/dv/tracer/otbn_tracer_sim_opts.hjson",
"{proj_root}/hw/top_earlgrey/dv/chip_dif_tests.hjson",
"{proj_root}/hw/top_earlgrey/dv/chip_mask_rom_tests.hjson",
]
// Override existing project defaults to supply chip-specific values.
overrides: [
// Chip level design is markedly different from our Comportable IPs (and so
// is our coverage goals). The coverage goals also differ between 'default'
// and the 'cover_reg_top' (used by common tests) builds. We override the
// variables below to swap the coverage cfg files used for the Comportable
// IPs with chip-specific ones. See `doc/ug/dv_methodology.md` for more
// details.
// Used by all chip level functional test. Collects coverage on the IO
// boundary of all pre-verified IPs and full coverage on non-pre-verified
// IPs. See `hw/dv/tools/dvsim/common_sim_cfg.hjson` for the default value.
{
name: default_vcs_cov_cfg_file
value: "-cm_hier {proj_root}/hw/top_earlgrey/dv/cov/chip_cover.cfg"
}
// Used by 'cover_reg_top' only builds - we only cover the *_reg_top of
// the non-pre-verified modules at the chip level. See
// `hw/dv/tools/dvsim//common_sim_cfg.hjson` for the default value.
{
name: cover_reg_top_vcs_cov_cfg_file
value: "-cm_hier {proj_root}/hw/top_earlgrey/dv/cov/chip_cover_reg_top.cfg"
}
// Used by the UNR flow.
{
name: vcs_unr_cfg_file
value: "{proj_root}/hw/top_earlgrey/dv/cov/unr.cfg"
}
// This defaults to 'ip' in `hw/data/common_project_cfg.hjson`.
{
name: design_level
value: "top"
}
]
// Default iterations for all tests - each test entry can override this.
reseed: 1
// Default UVM test and seq class name.
uvm_test: chip_base_test
uvm_test_seq: chip_sw_base_vseq
sw_build_device: sim_dv
// Add build modes.
build_modes: [
{
name: en_ibex_tracer
build_opts: ["+define+RVFI=1"]
}
]
// Add options needed to compile against otbn_memutil, otbn_tracer, and
// memutil_dpi_scrambled.
en_build_modes: ["{tool}_otbn_memutil_build_opts",
"{tool}_otbn_tracer_build_opts",
"{tool}_memutil_dpi_scrambled_build_opts"]
// Add run modes.
run_modes: [
{ // This base mode initializes the OTP / life cycle with the DEV state
name: base_otp_lc_dev_mode
sw_images: ["sw/device/otp_img/otp_img:3"],
run_opts: ["+sw_build_bin_dir={sw_build_dir}/build-bin",
"+sw_build_device={sw_build_device}",
// Separate individual SW images supplied to +sw_images plusarg by comma.
"+sw_images={eval_cmd} echo {sw_images} | sed -E 's/\\s+/,/g'"]
}
{
name: sw_test_mode
sw_images: ["sw/device/boot_rom/boot_rom:0"]
en_run_modes: ["base_otp_lc_dev_mode"]
}
{
name: stub_cpu_mode
en_run_modes: ["base_otp_lc_dev_mode"]
run_opts: ["+stub_cpu=1"]
}
{
// Append stub cpu mode to csr_tests_mode, run with 20 reseeds.
name: csr_tests_mode
en_run_modes: ["stub_cpu_mode"]
reseed: 20
}
{
// Append stub cpu mode to mem_tests_mode, run with 20 reseeds.
name: mem_tests_mode
en_run_modes: ["stub_cpu_mode"]
reseed: 20
}
{
name: xbar_mode
en_run_modes: ["base_otp_lc_dev_mode"]
run_opts: ["+xbar_mode=1"]
reseed: 100
}
]
// List of test specifications.
//
// If you are adding a test that has been generated from the `sw_tests`
// dictionary declared in `sw/device/tests/meson.build`, the `sw_images` list
// below should contain `sw/device/tests/<sw_test_name>` (without any more
// subdirectories) because that is where the meson target is created. For
// example `dif_plic_smoketest` is added to `sw_tests` in
// `sw/device/tests/dif/meson.build`, but the final meson targets all start
// `sw/device/tests/dif_plic_smoketest_`.
//
// Each entry in `sw_images` is followed by an index separated with ':' which
// is used by the testbench to know what type of image is it:
// - 0 for boot_rom,
// - 1 for SW test,
// - 2 for OTBN test,
// - 3 for OTP and so on
// This allows an arbitrary number of SW images to be supplied to the TB.
tests: [
{
name: chip_sw_uart_tx_rx
uvm_test_seq: chip_sw_uart_tx_rx_vseq
sw_images: ["sw/device/tests/uart_tx_rx_test:1"]
en_run_modes: ["sw_test_mode"]
reseed: 10
}
{
name: chip_sw_uart_tx_rx_idx1
uvm_test_seq: chip_sw_uart_tx_rx_vseq
sw_images: ["sw/device/tests/uart_tx_rx_test:1"]
en_run_modes: ["sw_test_mode"]
run_opts: ["+uart_idx=1"]
reseed: 10
}
{
name: chip_sw_uart_tx_rx_idx2
uvm_test_seq: chip_sw_uart_tx_rx_vseq
sw_images: ["sw/device/tests/uart_tx_rx_test:1"]
en_run_modes: ["sw_test_mode"]
run_opts: ["+uart_idx=2"]
reseed: 10
}
{
name: chip_sw_uart_tx_rx_idx3
uvm_test_seq: chip_sw_uart_tx_rx_vseq
sw_images: ["sw/device/tests/uart_tx_rx_test:1"]
en_run_modes: ["sw_test_mode"]
run_opts: ["+uart_idx=3"]
reseed: 10
}
{
name: chip_sw_uart_tx_rx_bootstrap
uvm_test_seq: chip_sw_uart_tx_rx_vseq
sw_images: ["sw/device/tests/uart_tx_rx_test:1"]
en_run_modes: ["sw_test_mode"]
run_opts: ["+use_spi_load_bootstrap=1"]
}
{
name: chip_sw_spi_device_tx_rx
uvm_test_seq: chip_sw_spi_tx_rx_vseq
sw_images: ["sw/device/tests/spi_tx_rx_test:1"]
en_run_modes: ["sw_test_mode"]
}
{
name: chip_sw_gpio
uvm_test_seq: chip_sw_gpio_vseq
sw_images: ["sw/device/tests/gpio_test:1"]
en_run_modes: ["sw_test_mode"]
}
{
name: chip_sw_flash_ctrl_access
uvm_test_seq: chip_sw_base_vseq
sw_images: ["sw/device/tests/flash_ctrl_test:1"]
en_run_modes: ["sw_test_mode"]
}
{
name: chip_sw_lc_ctrl_otp_hw_cfg
uvm_test_seq: chip_sw_base_vseq
sw_images: ["sw/device/tests/lc_ctrl_otp_hw_cfg_test:1"]
en_run_modes: ["sw_test_mode"]
}
{
name: chip_sw_pwrmgr_usbdev_smoketest
uvm_test_seq: chip_sw_base_vseq
sw_images: ["sw/device/tests/pwrmgr_usbdev_smoketest:1"]
en_run_modes: ["sw_test_mode"]
run_opts: ["+sw_test_timeout_ns=2000000"]
}
{
name: chip_sw_rv_timer_irq
uvm_test_seq: chip_sw_base_vseq
sw_images: ["sw/device/tests/dif_rv_timer_smoketest:1"]
en_run_modes: ["sw_test_mode"]
}
{
name: chip_sw_coremark
uvm_test_seq: chip_sw_base_vseq
sw_images: ["sw/device/benchmarks/coremark/coremark_top_earlgrey:1:external"]
en_run_modes: ["sw_test_mode"]
run_opts: ["+en_uart_logger=1",
"+sw_test_timeout_ns=22000000"]
}
// The test below is from tl_access_tests.hjson, but we don't need to include tl_intg_err,
// which is also in tl_access_tests.hjson, as TLUL integrity is generated by design and we
// include this block in the data path when we stub CPU to verify TL access
// So copy chip_tl_errors here and append the stub_cpu_mode run mode.
{
name: chip_tl_errors
build_mode: "cover_reg_top"
uvm_test_seq: "{name}_common_vseq"
run_opts: ["+run_tl_errors"]
en_run_modes: ["stub_cpu_mode"]
reseed: 20
}
]
// List of regressions.
regressions: [
{
name: smoke
tests: ["chip_sw_uart_tx_rx"]
}
]
}