hw/top_earlgrey/dv/chip_rom_tests.hjson

// Copyright lowRISC contributors.
// Licensed under the Apache License, Version 2.0, see LICENSE for details.
// SPDX-License-Identifier: Apache-2.0
{
  # This auxiliary chip sim cfg specification focuses on chip level rom functional tests.
  # Please see chip_sim_cfg.hjson for full setup details.

  # Note: Please maintain alphabetical order.
  tests: [
    // ROM E2E tests.
    {
      name: rom_e2e_smoke
      uvm_test_seq: chip_sw_base_vseq
      sw_images: ["//sw/device/silicon_creator/rom/e2e:empty_test_slot_a:1:signed:ot_flash_binary"]
      en_run_modes: ["sw_test_mode_rom"]
      run_opts: ["+sw_test_timeout_ns=20000000"]
    }
    {
      name: rom_e2e_shutdown_exception_c
      uvm_test_seq: chip_sw_rom_e2e_shutdown_exception_c_vseq
      sw_images: ["//sw/device/silicon_creator/rom/e2e:rom_e2e_shutdown_exception_c:1:signed"]
      en_run_modes: ["sw_test_mode_rom"]
      run_opts: [
        "+sw_test_timeout_ns=20000000",
        "+bypass_alert_ready_to_end_check=1",
      ]
      run_timeout_mins: 120
    }
    {
      name: rom_e2e_shutdown_output
      uvm_test_seq: chip_sw_rom_e2e_shutdown_output_vseq
      # Note: this is an unsigned test, as we are verifying a boot failure.
      sw_images: [
        "//sw/device/silicon_creator/rom/e2e:empty_test_slot_a:1:ot_flash_binary",
        "//sw/device/silicon_creator/rom/e2e:otp_img_shutdown_output_test_unlocked0:3",
      ]
      en_run_modes: ["sw_test_mode_rom"]
      run_opts: [
        "+sw_test_timeout_ns=20000000",
        "+use_otp_image=OtpTypeCustom",
        "+bypass_alert_ready_to_end_check=1",
      ]
    }
    {
      name: rom_e2e_static_critical
      uvm_test_seq: chip_sw_base_vseq
      sw_images: ["//sw/device/silicon_creator/rom/e2e:rom_e2e_static_critical:1:signed"]
      en_run_modes: ["sw_test_mode_rom"]
      run_opts: ["+sw_test_timeout_ns=20000000"]
    }
    {
      name: rom_e2e_keymgr_init
      uvm_test_seq: chip_sw_base_vseq
      sw_images: ["//sw/device/silicon_creator/rom/e2e:rom_e2e_keymgr_init:1:signed"]
      en_run_modes: ["sw_test_mode_rom"]
      run_opts: ["+sw_test_timeout_ns=20000000"]
      run_timeout_mins: 120
    }

    // Signed chip-level tests to be run with ROM, instead of test ROM.
    {
      name: chip_sw_uart_smoketest_signed
      uvm_test_seq: chip_sw_uart_smoke_vseq
      sw_images: ["//sw/device/tests:uart_smoketest_signed:1:signed"]
      en_run_modes: ["sw_test_mode_rom"]
      run_opts: ["+sw_test_timeout_ns=20000000"]
      run_timeout_mins: 180
    }

    // ROM func tests to be run with test ROM.
    {
      name: rom_keymgr_functest
      uvm_test_seq: chip_sw_base_vseq
      sw_images: ["//sw/device/silicon_creator/lib/drivers:keymgr_functest:1"]
      en_run_modes: ["sw_test_mode_test_rom"]
      run_opts: ["+sw_test_timeout_ns=10000000"]
    }
  ]

  regressions: [
    {
      name: rom_functests
      tests: ["rom_keymgr_functest"]
    }
    {
      name: signed
      tests: ["chip_sw_uart_smoketest_signed"]
    }
  ]
}