| /* |
| * Copyright 2023 Google LLC |
| * Copyright lowRISC contributors |
| * |
| * Licensed under the Apache License, Version 2.0 (the "License"); |
| * you may not use this file except in compliance with the License. |
| * You may obtain a copy of the License at |
| * |
| * http://www.apache.org/licenses/LICENSE-2.0 |
| * |
| * Unless required by applicable law or agreed to in writing, software |
| * distributed under the License is distributed on an "AS IS" BASIS, |
| * WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied. |
| * See the License for the specific language governing permissions and |
| * limitations under the License. |
| */ |
| |
| // Run kelvin_chechsum test from SMC |
| |
| #include "hw/top_matcha/ip/ml_top/data/ml_top_regs.h" // Generated. |
| #include "hw/top_matcha/sw/autogen/top_matcha.h" |
| #include "sw/device/lib/arch/device.h" |
| #include "sw/device/lib/dif/dif_uart.h" |
| #include "sw/device/lib/runtime/hart.h" |
| #include "sw/device/lib/runtime/log.h" |
| #include "sw/device/lib/runtime/print.h" |
| #include "sw/device/lib/testing/test_framework/check.h" |
| #include "sw/device/lib/testing/test_framework/ottf_test_config.h" |
| #include "sw/device/lib/testing/test_framework/status.h" |
| #include "sw/device/lib/testing/test_framework/test_util.h" |
| #include "sw/device/tests/testdata/test_image.h" |
| |
| #define ML_DMEM_INPUT_OFFSET_ADDR 0x00300000 |
| #define ML_DMEM_OUT_OFFSET_ADDR 0x00380000 |
| |
| OTTF_DEFINE_TEST_CONFIG(); |
| |
| static dif_uart_t smc_uart; |
| |
| void _ottf_main(void) { |
| uint32_t mem_val; |
| uint32_t intr_state; |
| |
| test_status_set(kTestStatusInTest); |
| // Initialize the SMC UART to enable logging for non-DV simulation platforms. |
| if (kDeviceType != kDeviceSimDV) { |
| init_uart(TOP_MATCHA_SMC_UART_BASE_ADDR, &smc_uart); |
| } |
| |
| // Write DMEM with initial values |
| const uint32_t *input = (const uint32_t *)hps_0; |
| mmio_region_t ml_dmem_base = mmio_region_from_addr( |
| TOP_MATCHA_RAM_ML_DMEM_BASE_ADDR + ML_DMEM_INPUT_OFFSET_ADDR); |
| for (uintptr_t word_idx = 0; word_idx < hps_0_len / sizeof(uint32_t); |
| ++word_idx) { |
| uintptr_t offset = word_idx * sizeof(uint32_t); |
| mmio_region_write32(ml_dmem_base, offset, input[word_idx]); |
| } |
| |
| // Set ML_TOP_Core registers |
| mmio_region_t base_addr = |
| mmio_region_from_addr(TOP_MATCHA_ML_TOP_CORE_BASE_ADDR); |
| // Un-freeze clock and Reset of ML_TOP |
| mmio_region_write32(base_addr, ML_TOP_CTRL_REG_OFFSET, |
| ML_TOP_CTRL_REG_RESVAL); |
| mem_val = mmio_region_read32(base_addr, ML_TOP_CTRL_REG_OFFSET); |
| CHECK(mem_val == ML_TOP_CTRL_REG_RESVAL, |
| "ML_TOP_CTRL read out: expected : 0x%x | actual: 0x%x", |
| ML_TOP_CTRL_REG_RESVAL, mem_val); |
| |
| // Release the Reset of ML_TOP |
| mmio_region_write32(base_addr, ML_TOP_CTRL_REG_OFFSET, 0x0); |
| |
| // Wait for a interrupt |
| intr_state = mmio_region_read32(base_addr, ML_TOP_INTR_STATE_REG_OFFSET); |
| CHECK(intr_state == 0, |
| "ML_TOP_Core offset 0 INTR_STATE - Expected: 0x0 | Actual: 0x%x", |
| intr_state); |
| |
| while (intr_state == 0x0) { |
| intr_state = mmio_region_read32(base_addr, ML_TOP_INTR_STATE_REG_OFFSET); |
| busy_spin_micros(200); |
| } |
| |
| // Received interrupts from Kelvin core, check if only FINISH asserted |
| CHECK(intr_state == (1 << ML_TOP_INTR_STATE_FINISH_BIT), |
| "INTR_STATE read out: expected : 0x%x | actual: 0x%x", |
| (1 << ML_TOP_INTR_STATE_FINISH_BIT), intr_state); |
| |
| // Check kelvin result. The program sums to the data stored in the test |
| // range 0x5A300000 to 0x5A312c00, and stored at 0x5A380000 |
| ml_dmem_base = mmio_region_from_addr(TOP_MATCHA_RAM_ML_DMEM_BASE_ADDR); |
| mem_val = mmio_region_read32(ml_dmem_base, ML_DMEM_OUT_OFFSET_ADDR); |
| const uint32_t kExpectedSum = 0x0d42e16c; |
| CHECK(mem_val == kExpectedSum, |
| "Mismatch output - Expected: 0x%x | Actual: 0x%x", kExpectedSum, |
| mem_val); |
| test_status_set(kTestStatusPassed); |
| } |