[dv] Fix stress_all failure in i2c and pattgen
intr_test needs to have scb enabled
I have run a 20+ seeds and they're passing
Signed-off-by: Weicai Yang <weicai@google.com>
diff --git a/hw/ip/i2c/dv/env/seq_lib/i2c_stress_all_vseq.sv b/hw/ip/i2c/dv/env/seq_lib/i2c_stress_all_vseq.sv
index 0102592..b81ed32 100644
--- a/hw/ip/i2c/dv/env/seq_lib/i2c_stress_all_vseq.sv
+++ b/hw/ip/i2c/dv/env/seq_lib/i2c_stress_all_vseq.sv
@@ -75,7 +75,7 @@
i2c_common_vseq common_vseq;
`downcast(common_vseq, i2c_vseq);
common_vseq.common_seq_type = "intr_test";
- cfg.en_scb = 1'b0;
+ cfg.en_scb = 1'b1;
end
"i2c_override_vseq": begin
cfg.en_scb = 1'b0;
diff --git a/hw/ip/pattgen/dv/env/seq_lib/pattgen_stress_all_vseq.sv b/hw/ip/pattgen/dv/env/seq_lib/pattgen_stress_all_vseq.sv
index ce46779..8ab2b87 100644
--- a/hw/ip/pattgen/dv/env/seq_lib/pattgen_stress_all_vseq.sv
+++ b/hw/ip/pattgen/dv/env/seq_lib/pattgen_stress_all_vseq.sv
@@ -53,17 +53,11 @@
pattgen_vseq.set_sequencer(p_sequencer);
`DV_CHECK_RANDOMIZE_FATAL(pattgen_vseq)
- case (seq_name)
- "pattgen_common_vseq": begin
- pattgen_common_vseq common_vseq;
- `downcast(common_vseq, pattgen_vseq);
- common_vseq.common_seq_type = "intr_test";
- cfg.en_scb = 1'b0;
- end
- default: begin
- cfg.en_scb = 1'b1;
- end
- endcase
+ if (seq_name == "pattgen_common_vseq") begin
+ pattgen_common_vseq common_vseq;
+ `downcast(common_vseq, pattgen_vseq);
+ common_vseq.common_seq_type = "intr_test";
+ end
// run vseq
pattgen_vseq.start(p_sequencer);
seq_run_hist[seq_name]++;