commit 196c7ca8bfca04d303263ee3c713daecae398c16
author Eli Kim <eli@opentitan.org> Thu Oct 06 11:07:12 2022 -0700
committer Eli Kim <github@elikim.dev> Thu Oct 06 16:20:37 2022 -0700
tree 68ed10abeb7b372a93307b0bf3e129202f0e2d8f
parent 691ebe22351e94e566518f020330114451cdc6c6

feat(chip): Scaffolds SW test for sleep_pin_retention

This commit defines `sleep_pin_retention` SW test in bazel and creates a
SW skeleton code under `sw/device/tests/sim_dv/`.

Signed-off-by: Eli Kim <eli@opentitan.org>

sw/device/tests/sim_dv/BUILD

diff --git a/sw/device/tests/sim_dv/BUILD b/sw/device/tests/sim_dv/BUILD
index b24f9ae..6d31cba 100644
--- a/sw/device/tests/sim_dv/BUILD
+++ b/sw/device/tests/sim_dv/BUILD
@@ -653,6 +653,22 @@
 )
 
 opentitan_functest(
+    name = "sleep_pin_retention_test",
+    srcs = ["sleep_pin_retention_test.c"],
+    targets = ["dv"],
+    deps = [
+        "//hw/top_earlgrey/sw/autogen:top_earlgrey",
+        "//sw/device/lib/base:mmio",
+        "//sw/device/lib/dif:pinmux",
+        "//sw/device/lib/dif:pwrmgr",
+        "//sw/device/lib/runtime:log",
+        "//sw/device/lib/testing:pwrmgr_testutils",
+        "//sw/device/lib/testing:rand_testutils",
+        "//sw/device/lib/testing/test_framework:ottf_main",
+    ],
+)
+
+opentitan_functest(
     name = "spi_tx_rx_test",
     srcs = ["spi_tx_rx_test.c"],
     targets = ["dv"],

sw/device/tests/sim_dv/sleep_pin_retention_test.c

diff --git a/sw/device/tests/sim_dv/sleep_pin_retention_test.c b/sw/device/tests/sim_dv/sleep_pin_retention_test.c
new file mode 100644
index 0000000..aa46423
--- /dev/null
+++ b/sw/device/tests/sim_dv/sleep_pin_retention_test.c
@@ -0,0 +1,36 @@
+// Copyright lowRISC contributors.
+// Licensed under the Apache License, Version 2.0, see LICENSE for details.
+// SPDX-License-Identifier: Apache-2.0
+
+#include "sw/device/lib/base/mmio.h"
+#include "sw/device/lib/dif/dif_pinmux.h"
+#include "sw/device/lib/dif/dif_pwrmgr.h"
+#include "sw/device/lib/runtime/log.h"
+#include "sw/device/lib/testing/pwrmgr_testutils.h"
+#include "sw/device/lib/testing/rand_testutils.h"
+#include "sw/device/lib/testing/test_framework/check.h"
+#include "sw/device/lib/testing/test_framework/ottf_main.h"
+
+#include "hw/top_earlgrey/sw/autogen/top_earlgrey.h"
+
+OTTF_DEFINE_TEST_CONFIG();
+
+static dif_pwrmgr_t pwrmgr;
+static dif_pinmux_t pinmux;
+
+// SV randomizes the round of entering/exiting sleep then set this volatile
+// variable via backdoor_overwrite.
+static volatile const uint8_t kRounds = 2;
+
+// SW testcode randomly chooses the value for 8 GPIO pins (pins are fixed) then
+// invert the value for retention. SW will sends the value to SV testbench via
+// LOG_INFO().
+static const uint8_t kGpioVal = 0x00;
+
+bool test_main(void) {
+  bool result = false;
+
+  LOG_INFO("Num Rounds: %3d", kRounds);
+
+  return result;
+}