[ottf] Add missing test configs to tests
Signed-off-by: Alphan Ulusoy <alphan@google.com>
diff --git a/sw/device/examples/hello_usbdev/BUILD b/sw/device/examples/hello_usbdev/BUILD
index 0509ab8..1f51e33 100644
--- a/sw/device/examples/hello_usbdev/BUILD
+++ b/sw/device/examples/hello_usbdev/BUILD
@@ -41,5 +41,6 @@
"//sw/device/lib/testing:pinmux_testutils",
"//sw/device/lib/testing/test_framework:check",
"//sw/device/lib/testing/test_framework:ottf_start",
+ "//sw/device/lib/testing/test_framework:ottf_test_config",
],
)
diff --git a/sw/device/examples/hello_usbdev/hello_usbdev.c b/sw/device/examples/hello_usbdev/hello_usbdev.c
index b56e40f..c6351a6 100644
--- a/sw/device/examples/hello_usbdev/hello_usbdev.c
+++ b/sw/device/examples/hello_usbdev/hello_usbdev.c
@@ -16,6 +16,7 @@
#include "sw/device/lib/runtime/print.h"
#include "sw/device/lib/testing/pinmux_testutils.h"
#include "sw/device/lib/testing/test_framework/check.h"
+#include "sw/device/lib/testing/test_framework/ottf_test_config.h"
#include "sw/device/lib/usb_controlep.h"
#include "sw/device/lib/usb_simpleserial.h"
#include "sw/device/lib/usbdev.h"
@@ -28,6 +29,8 @@
#define REG32(add) *((volatile uint32_t *)(add))
+OTTF_DEFINE_TEST_CONFIG();
+
/**
* Configuration values for USB.
*/
diff --git a/sw/device/examples/hello_world/BUILD b/sw/device/examples/hello_world/BUILD
index 28da81e..de2c6d9 100644
--- a/sw/device/examples/hello_world/BUILD
+++ b/sw/device/examples/hello_world/BUILD
@@ -39,5 +39,6 @@
"//sw/device/lib/testing:pinmux_testutils",
"//sw/device/lib/testing/test_framework:check",
"//sw/device/lib/testing/test_framework:ottf_start",
+ "//sw/device/lib/testing/test_framework:ottf_test_config",
],
)
diff --git a/sw/device/examples/hello_world/hello_world.c b/sw/device/examples/hello_world/hello_world.c
index 5efd0f0..c0b0737 100644
--- a/sw/device/examples/hello_world/hello_world.c
+++ b/sw/device/examples/hello_world/hello_world.c
@@ -13,9 +13,12 @@
#include "sw/device/lib/runtime/print.h"
#include "sw/device/lib/testing/pinmux_testutils.h"
#include "sw/device/lib/testing/test_framework/check.h"
+#include "sw/device/lib/testing/test_framework/ottf_test_config.h"
#include "hw/top_earlgrey/sw/autogen/top_earlgrey.h"
+OTTF_DEFINE_TEST_CONFIG();
+
static dif_gpio_t gpio;
static dif_pinmux_t pinmux;
static dif_spi_device_handle_t spi;
diff --git a/sw/device/sca/BUILD b/sw/device/sca/BUILD
index a65b65e..9dc2755 100644
--- a/sw/device/sca/BUILD
+++ b/sw/device/sca/BUILD
@@ -15,6 +15,7 @@
"//sw/device/lib/dif:aes",
"//sw/device/lib/runtime:log",
"//sw/device/lib/testing/test_framework:ottf_start",
+ "//sw/device/lib/testing/test_framework:ottf_test_config",
"//sw/device/sca/lib:prng",
"//sw/device/sca/lib:sca",
"//sw/device/sca/lib:simple_serial",
@@ -30,6 +31,7 @@
"//sw/device/lib/dif:kmac",
"//sw/device/lib/runtime:log",
"//sw/device/lib/testing/test_framework:ottf_start",
+ "//sw/device/lib/testing/test_framework:ottf_test_config",
"//sw/device/sca/lib:prng",
"//sw/device/sca/lib:sca",
"//sw/device/sca/lib:simple_serial",
diff --git a/sw/device/sca/aes_serial.c b/sw/device/sca/aes_serial.c
index 65f59cd..f27a821 100644
--- a/sw/device/sca/aes_serial.c
+++ b/sw/device/sca/aes_serial.c
@@ -5,6 +5,7 @@
#include "sw/device/lib/base/memory.h"
#include "sw/device/lib/dif/dif_aes.h"
#include "sw/device/lib/runtime/log.h"
+#include "sw/device/lib/testing/test_framework/ottf_test_config.h"
#include "sw/device/sca/lib/prng.h"
#include "sw/device/sca/lib/sca.h"
#include "sw/device/sca/lib/simple_serial.h"
@@ -28,6 +29,8 @@
* mode. See https://wiki.newae.com/SimpleSerial for details on the protocol.
*/
+OTTF_DEFINE_TEST_CONFIG();
+
enum {
kAesKeyLength = 16,
kAesTextLength = 16,
diff --git a/sw/device/sca/sha3_serial.c b/sw/device/sca/sha3_serial.c
index b82d115..60f52cf 100644
--- a/sw/device/sca/sha3_serial.c
+++ b/sw/device/sca/sha3_serial.c
@@ -6,6 +6,7 @@
#include "sw/device/lib/base/memory.h"
#include "sw/device/lib/dif/dif_kmac.h"
#include "sw/device/lib/runtime/log.h"
+#include "sw/device/lib/testing/test_framework/ottf_test_config.h"
#include "sw/device/sca/lib/prng.h"
#include "sw/device/sca/lib/sca.h"
#include "sw/device/sca/lib/simple_serial.h"
@@ -29,6 +30,8 @@
* https://wiki.newae.com/SimpleSerial for details on the protocol.
*/
+OTTF_DEFINE_TEST_CONFIG();
+
enum {
/**
* Key length in bytes.
diff --git a/sw/device/tests/ast_clk_outs_test.c b/sw/device/tests/ast_clk_outs_test.c
index 81536f0..1218b35 100644
--- a/sw/device/tests/ast_clk_outs_test.c
+++ b/sw/device/tests/ast_clk_outs_test.c
@@ -13,6 +13,8 @@
#include "hw/top_earlgrey/sw/autogen/top_earlgrey.h"
+OTTF_DEFINE_TEST_CONFIG();
+
/**
* AST CLK OUTPUTS TEST
*
diff --git a/sw/device/tests/crt_test.c b/sw/device/tests/crt_test.c
index 43e70d8..5ef44a8 100644
--- a/sw/device/tests/crt_test.c
+++ b/sw/device/tests/crt_test.c
@@ -13,10 +13,13 @@
#include "sw/device/lib/runtime/log.h"
#include "sw/device/lib/runtime/print.h"
#include "sw/device/lib/testing/test_framework/check.h"
+#include "sw/device/lib/testing/test_framework/ottf_test_config.h"
#include "sw/device/lib/testing/test_framework/status.h"
#include "hw/top_earlgrey/sw/autogen/top_earlgrey.h"
+OTTF_DEFINE_TEST_CONFIG();
+
// Symbols defined in `sw/device/lib/testing/test_framework/ottf.ld`,
// which we use to check that the CRT did what it was supposed to.
extern char _bss_start;
diff --git a/sw/device/tests/hmac_enc_test.c b/sw/device/tests/hmac_enc_test.c
index efcbfe8..3c84aee 100644
--- a/sw/device/tests/hmac_enc_test.c
+++ b/sw/device/tests/hmac_enc_test.c
@@ -11,6 +11,8 @@
#include "hw/top_earlgrey/sw/autogen/top_earlgrey.h"
+OTTF_DEFINE_TEST_CONFIG();
+
static const dif_hmac_transaction_t kHmacTransactionConfig = {
.digest_endianness = kDifHmacEndiannessLittle,
.message_endianness = kDifHmacEndiannessLittle,
diff --git a/sw/device/tests/plic_sw_irq_test.c b/sw/device/tests/plic_sw_irq_test.c
index 42c7a31..4f0c42f 100644
--- a/sw/device/tests/plic_sw_irq_test.c
+++ b/sw/device/tests/plic_sw_irq_test.c
@@ -15,6 +15,8 @@
#include "hw/top_earlgrey/sw/autogen/top_earlgrey.h"
#include "rv_plic_regs.h" // Generated.
+OTTF_DEFINE_TEST_CONFIG();
+
static const dif_rv_plic_target_t kPlicTarget = kTopEarlgreyPlicTargetIbex0;
static dif_rv_plic_t plic0;
diff --git a/sw/device/tests/rstmgr_alert_info_test.c b/sw/device/tests/rstmgr_alert_info_test.c
index e22ac21..e929df8 100644
--- a/sw/device/tests/rstmgr_alert_info_test.c
+++ b/sw/device/tests/rstmgr_alert_info_test.c
@@ -64,6 +64,8 @@
*/
+OTTF_DEFINE_TEST_CONFIG();
+
enum {
kWdogBarkMicros = 200, // us
kWdogBiteMicros = 200, // us
diff --git a/sw/device/tests/rstmgr_cpu_info_test.c b/sw/device/tests/rstmgr_cpu_info_test.c
index a195675..18cb88b 100644
--- a/sw/device/tests/rstmgr_cpu_info_test.c
+++ b/sw/device/tests/rstmgr_cpu_info_test.c
@@ -18,6 +18,8 @@
#include "hw/top_earlgrey/sw/autogen/top_earlgrey.h"
+OTTF_DEFINE_TEST_CONFIG();
+
/**
* RSTMGR CPU INFO TEST
* This test creates a double fault by accessing a register with
diff --git a/sw/device/tests/rstmgr_sw_rst_ctrl_test.c b/sw/device/tests/rstmgr_sw_rst_ctrl_test.c
index b67f55e..5f535b5 100644
--- a/sw/device/tests/rstmgr_sw_rst_ctrl_test.c
+++ b/sw/device/tests/rstmgr_sw_rst_ctrl_test.c
@@ -21,6 +21,8 @@
#include "spi_host_regs.h"
#include "usbdev_regs.h"
+OTTF_DEFINE_TEST_CONFIG();
+
/**
* RSTMGR SW_RST_CTRL Test
*
diff --git a/sw/device/tests/sensor_ctrl_alerts.c b/sw/device/tests/sensor_ctrl_alerts.c
index 9d75be2..5b9ad06 100644
--- a/sw/device/tests/sensor_ctrl_alerts.c
+++ b/sw/device/tests/sensor_ctrl_alerts.c
@@ -20,6 +20,8 @@
#include "hw/top_earlgrey/sw/autogen/top_earlgrey.h"
#include "sensor_ctrl_regs.h" // Generated.
+OTTF_DEFINE_TEST_CONFIG();
+
/**
* This test checks that incoming ast events can be
* configured as both recoverable and fatal.
diff --git a/sw/device/tests/sim_dv/BUILD b/sw/device/tests/sim_dv/BUILD
index b61673b..10c9949 100644
--- a/sw/device/tests/sim_dv/BUILD
+++ b/sw/device/tests/sim_dv/BUILD
@@ -184,6 +184,7 @@
"//sw/device/lib/testing:otp_ctrl_testutils",
"//sw/device/lib/testing/test_framework:check",
"//sw/device/lib/testing/test_framework:ottf_main",
+ "//sw/device/lib/testing/test_framework:ottf_test_config",
],
)
diff --git a/sw/device/tests/sim_dv/lc_walkthrough_test.c b/sw/device/tests/sim_dv/lc_walkthrough_test.c
index 1e8e91c..0d46730 100644
--- a/sw/device/tests/sim_dv/lc_walkthrough_test.c
+++ b/sw/device/tests/sim_dv/lc_walkthrough_test.c
@@ -11,11 +11,14 @@
#include "sw/device/lib/testing/lc_ctrl_testutils.h"
#include "sw/device/lib/testing/otp_ctrl_testutils.h"
#include "sw/device/lib/testing/test_framework/check.h"
+#include "sw/device/lib/testing/test_framework/ottf_test_config.h"
#include "hw/top_earlgrey/sw/autogen/top_earlgrey.h"
#define LC_TOKEN_SIZE 16
+OTTF_DEFINE_TEST_CONFIG();
+
static dif_lc_ctrl_t lc;
static dif_otp_ctrl_t otp;
static dif_rstmgr_t rstmgr;
diff --git a/sw/device/tests/sim_dv/lc_walkthrough_testunlocks_test.c b/sw/device/tests/sim_dv/lc_walkthrough_testunlocks_test.c
index 41a2060..cc4e802 100644
--- a/sw/device/tests/sim_dv/lc_walkthrough_testunlocks_test.c
+++ b/sw/device/tests/sim_dv/lc_walkthrough_testunlocks_test.c
@@ -11,11 +11,14 @@
#include "sw/device/lib/testing/lc_ctrl_testutils.h"
#include "sw/device/lib/testing/otp_ctrl_testutils.h"
#include "sw/device/lib/testing/test_framework/check.h"
+#include "sw/device/lib/testing/test_framework/ottf_test_config.h"
#include "hw/top_earlgrey/sw/autogen/top_earlgrey.h"
#define LC_TOKEN_SIZE 16
+OTTF_DEFINE_TEST_CONFIG();
+
static dif_lc_ctrl_t lc;
static dif_otp_ctrl_t otp;
static dif_rstmgr_t rstmgr;
diff --git a/sw/device/tests/sim_dv/pwrmgr_deep_sleep_all_wake_ups.c b/sw/device/tests/sim_dv/pwrmgr_deep_sleep_all_wake_ups.c
index 134ce8c..b34391b 100644
--- a/sw/device/tests/sim_dv/pwrmgr_deep_sleep_all_wake_ups.c
+++ b/sw/device/tests/sim_dv/pwrmgr_deep_sleep_all_wake_ups.c
@@ -17,6 +17,7 @@
#include "sw/device/lib/testing/test_framework/check.h"
#include "sw/device/lib/testing/test_framework/ottf_main.h"
#include "sw/device/lib/usbdev.h"
+
#include "hw/top_earlgrey/sw/autogen/top_earlgrey.h"
#include "pwrmgr_regs.h"
#include "sw/device/lib/testing/autogen/isr_testutils.h"
@@ -40,6 +41,8 @@
#define PINMUX_WKUP_DETECTOR5 5
+OTTF_DEFINE_TEST_CONFIG();
+
static dif_pwrmgr_t pwrmgr;
static dif_rv_plic_t rv_plic;
static dif_sysrst_ctrl_t sysrst_ctrl;
diff --git a/sw/device/tests/sim_dv/pwrmgr_normal_sleep_all_wake_ups.c b/sw/device/tests/sim_dv/pwrmgr_normal_sleep_all_wake_ups.c
index 5b1d915..6187e3c 100644
--- a/sw/device/tests/sim_dv/pwrmgr_normal_sleep_all_wake_ups.c
+++ b/sw/device/tests/sim_dv/pwrmgr_normal_sleep_all_wake_ups.c
@@ -39,6 +39,8 @@
*/
+OTTF_DEFINE_TEST_CONFIG();
+
static const uint32_t kPinmuxWkupDetector5 = 5;
static dif_pwrmgr_t pwrmgr;
diff --git a/sw/device/tests/sleep_pwm_pulses_test.c b/sw/device/tests/sleep_pwm_pulses_test.c
index 93b4e42..40cc28a 100644
--- a/sw/device/tests/sleep_pwm_pulses_test.c
+++ b/sw/device/tests/sleep_pwm_pulses_test.c
@@ -37,6 +37,8 @@
* Fixed pwm configuration, mode and 0 phase delay are chosen.
*/
+OTTF_DEFINE_TEST_CONFIG();
+
static const dif_pinmux_index_t kPinmuxOutsel[PWM_PARAM_N_OUTPUTS] = {
kTopEarlgreyPinmuxOutselPwmAonPwm0, kTopEarlgreyPinmuxOutselPwmAonPwm1,
kTopEarlgreyPinmuxOutselPwmAonPwm2, kTopEarlgreyPinmuxOutselPwmAonPwm3,
