diff --git a/sw/device/tests/BUILD b/sw/device/tests/BUILD
index ef67744..9e9f935 100644
--- a/sw/device/tests/BUILD
+++ b/sw/device/tests/BUILD
@@ -978,10 +978,9 @@
 
 matcha_dv_test(
     name = "clkmgr_reset_frequency_test",
-    srcs = ["@lowrisc_opentitan//sw/device/tests:clkmgr_reset_frequency_test.c"],
+    srcs = [":clkmgr_reset_frequency_test.c"],
     deps = [
-        ":test_dv_lib_opentitan",
-        "//sw/device/lib/arch:device",
+        ":test_dv_lib",
         "//sw/device/lib/testing:clkmgr_testutils",
         "@lowrisc_opentitan//sw/device/lib/dif:sensor_ctrl",
         "@lowrisc_opentitan//sw/device/lib/testing:aon_timer_testutils",
diff --git a/sw/device/tests/clkmgr_reset_frequency_test.c b/sw/device/tests/clkmgr_reset_frequency_test.c
new file mode 100644
index 0000000..1a574af
--- /dev/null
+++ b/sw/device/tests/clkmgr_reset_frequency_test.c
@@ -0,0 +1,92 @@
+// Copyright 2023 Google LLC.
+// Copyright lowRISC contributors.
+// Licensed under the Apache License, Version 2.0, see LICENSE for details.
+// SPDX-License-Identifier: Apache-2.0
+
+#include "hw/top_matcha/sw/autogen/top_matcha.h"
+#include "sw/device/lib/base/memory.h"
+#include "sw/device/lib/dif/dif_sensor_ctrl.h"
+#include "sw/device/lib/runtime/log.h"
+#include "sw/device/lib/testing/aon_timer_testutils.h"
+#include "sw/device/lib/testing/clkmgr_testutils.h"
+#include "sw/device/lib/testing/rstmgr_testutils.h"
+#include "sw/device/lib/testing/sensor_ctrl_testutils.h"
+#include "sw/device/lib/testing/test_framework/check.h"
+#include "sw/device/lib/testing/test_framework/ottf_main.h"
+
+OTTF_DEFINE_TEST_CONFIG();
+
+/**
+ * This test measure clock counts with clkmgr frequency measurements, performing
+ * 100 measurements per round. Measurement errors (fast or slow clocks) are
+ * recorded as recoverable error in clkmgr.
+ *
+ * This test configures the clock thresholds so it generates errors, after 100
+ * measurements it checks that some errors are found, then a reset is triggered,
+ * and it checks the measurements should be disabled, and no errors should be
+ * reported.
+ *
+ * Notice the test overrides the hardware behavior so it comes out with
+ * calibrated USB clock, otherwise the USB clock frequency will be incorrect.
+ * USB calibration should be a separate test, and may be vendor-specific.
+ */
+const unsigned int kMeasurementsPerRound = 100;
+
+bool test_main(void) {
+  dif_clkmgr_t clkmgr;
+  dif_rstmgr_t rstmgr;
+  dif_sensor_ctrl_t sensor_ctrl;
+
+  const uint32_t kMeasurementDelayMicros =
+      aon_timer_testutils_get_us_from_aon_cycles(kMeasurementsPerRound);
+
+  CHECK_DIF_OK(dif_clkmgr_init(
+      mmio_region_from_addr(TOP_MATCHA_CLKMGR_AON_BASE_ADDR), &clkmgr));
+  CHECK_DIF_OK(dif_sensor_ctrl_init(
+      mmio_region_from_addr(TOP_MATCHA_SENSOR_CTRL_BASE_ADDR), &sensor_ctrl));
+  CHECK_DIF_OK(dif_rstmgr_init(
+      mmio_region_from_addr(TOP_MATCHA_RSTMGR_AON_BASE_ADDR), &rstmgr));
+
+  LOG_INFO("TEST: wait for ast init");
+  IBEX_SPIN_FOR(sensor_ctrl_ast_init_done(&sensor_ctrl),
+                1000);  // Time out at 1000us
+  LOG_INFO("TEST: done ast init");
+
+  if (rstmgr_testutils_reset_info_any(&rstmgr, kDifRstmgrResetInfoPor)) {
+    LOG_INFO("POR reset");
+
+    // Configure the counters to trigger an error by setting them for external
+    // clocks.
+    clkmgr_testutils_enable_clock_counts_with_expected_thresholds(
+        &clkmgr, /*jitter_enabled=*/false, /*external_clk=*/true,
+        /*low_speed=*/true);
+    busy_spin_micros(kMeasurementDelayMicros);
+
+    // Check we get errors, but let the counters keep going.
+    dif_clkmgr_recov_err_codes_t err_codes;
+    CHECK_DIF_OK(dif_clkmgr_recov_err_code_get_codes(&clkmgr, &err_codes));
+    CHECK(err_codes != 0);
+
+    // Trigger a rstmgr SW reset.
+    CHECK_DIF_OK(dif_rstmgr_software_device_reset(&rstmgr));
+
+    // Add delay such that the software reset can take effect
+    busy_spin_micros(100);
+
+    // This should not be reached.
+    LOG_ERROR("This is unreachable since a reset should have been triggered");
+    return false;
+  } else if (rstmgr_testutils_reset_info_any(&rstmgr, kDifRstmgrResetInfoSw)) {
+    LOG_INFO("Back from rstmgr SW reset");
+    CHECK(clkmgr_testutils_check_measurement_enables(&clkmgr,
+                                                     kDifToggleDisabled));
+    CHECK(clkmgr_testutils_check_measurement_counts(&clkmgr));
+    return true;
+  } else {
+    dif_rstmgr_reset_info_bitfield_t rst_info;
+    CHECK_DIF_OK(dif_rstmgr_reset_info_get(&rstmgr, &rst_info));
+    LOG_ERROR("Unexpected rst_info 0x%x", rst_info);
+    return false;
+  }
+  return true;
+}